About Us
Development of our sockets began over 20 years ago in an IC Evaluation Lab.
A requirement was for a method of contacting the Device Under Test to the Evaluation PCB with nothing between.
The IC designers were finding it difficult using the currently available socket solutions to achieve the same level of IC performance as with soldered down devices.
Today we we manufacture to order a standard range of sockets principally designed for use in experimental labs such as IC Evaluation labs, IC Failure Analysis Labs and IC Application Labs.
We work closely with our customers, often getting requests for custom adaptations or something new to meet their needs.
Original Design Brief
Press IC contacts direct to PCB pads.
Top window to allow access to exposed die devices.
Cover a temperature range of -55°C to 125°C.
To work well with Forced Air Temperature forcing systems.
A cost that did not prohibit modifying the socket to allow unusual experiments to be carried out. Using expensive contacting solutions it is hard to justify cutting and drilling into it so possibly making it unsuitable for future use.